Integration
without compromise.

Combining light and electron microscopy for better results.

application example

image courtesy of C.J. Peddie and L.M. Collinson, CRUK LRI

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application example

sample courtesy of P. de Boer and B.N.G. Giepmans, UMCG

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sample courtesy of P. de Boer and B.N.G. Giepmans, UMCG

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sample courtesy of H. Schwarz, MPI Tübingen

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sample courtesy of M.J. Mourik, LUMC

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sample courtesy of T. Templier and R.H.R. Hahnloser, University of Zurich and ETH Zurich

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sample courtesy of M.J. Mourik, LUMC


Events

June 16 2015

Seminar CL Applications

DTU-CEN

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June 18 2015

Delphi workshop

CFIM, University of Copenhagen

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June 18 2015

Colloquium CL

MESA+, Applied Nanophotonics

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June 24 2015

Delphi workshop

Francis Crick Institute, London

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June 29 2015

MMC 2015

Manchester, booth 102

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Aug 2 2015

M&M 2015

Portland, booth 338

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Sept 1 2015

Delphi workshop

Maastricht

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News

Nanoparticle coating eliminates reflection from glass

June 8, 2015

Reflection of light off glass surfaces is a problem occurring in everyday life, and hinders the performance of solar panels, smart phone and tablet displays. Researchers from FOM institute AMOLF have found a new and simple method to eliminate this reflection, by printing a silica nanopatterned antireflection coating onto the device.

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Two more Delphi workshops coming up

May 5, 2015

There are still some places available for the Delphi workshop at the University of Copenhagen on the 18th of June and the Delphi workshop at the Francis Crick Institute on the 24th of June.

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Impressions of the first Delphi workshop

April 9, 2015

On the 26th of March, 20 participants joined the first hands-on Delphi workshop at the MPI CBG in Dresden to learn about correlative microscopy and to get experience with our newest correlative solution, the Delphi

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Nanoscale optical tomography with cathodoluminescence spectroscopy

April 8, 2015

Engineers at Stanford University and the FOM Institute AMOLF have developed a way to visualise the optical properties of objects that are thousands of times smaller than a grain of sand, in 3-D and with nanometer-scale resolution.

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