The SECOM platform combines optical and scanning electron microscopy in a single device. This allows for high-throughput correlative microscopy as well as novel applications in nanophotonics.
Image courtesy Ruud van Tol
Correlative microscopy combines functional and structural information in a single image. The SECOM platform makes it possible to do high-throughput correlative microscopy with high overlay precision.
Image copyright J.Wiley & Sons 2009
The SPARC system enables high efficiency cathodoluminescence detection for applications in nanophotonics and material characterization.
Image courtesy Ernst Jan Vesseur
The SPARC allows for new kinds of experiments in nanophotonics. For example, nanoantennas can be excited with the electron beam while their optical response is monitored.
Image courtesy Dominique Heinis and Jacob Hoogenboom
DELMIC products are focused on high performance, user friendly, integrated, solutions. The company has two product lines:
Correlative microscopy combines functional information from fluorescence microscopy with structural information from the electron microscope. The SECOM platform integrates a fluorescence microscope with a scanning electron microscope. This combination makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation as simple as drag-and-drop.
The SPARC system allows for new kinds of experiments in nanophotonics. Maximum collection efficiency is ensured through the precise alignment of the mirror with respect to the electron beam combined with top-of-the-line detectors. This makes it possible to probe structures with very low photon yield. The SPARC system also offers the unique feature of doing angle resolved measurements, enabling momentum spectroscopy.