Integrated design
DELMIC products are focused on high performance, user friendly, integrated, solutions. The company has two product lines:
Correlative microscopy
Correlative microscopy combines functional information from fluorescence microscopy with structural information from the electron microscope. The SECOM platform integrates a fluorescence microscope with a scanning electron microscope. This combination makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation as simple as drag-and-drop.
Novel nanophotonics
The SPARC system allows for new kinds of experiments in nanophotonics. Maximum collection efficiency is ensured through the precise alignment of the mirror with respect to the electron beam combined with top-of-the-line detectors. This makes it possible to probe structures with very low photon yield. The SPARC system also offers the unique feature of doing angle resolved measurements, enabling momentum spectroscopy.




