Collect nanoscale detail while retaining larger context of the sample
Cathodoluminescence solutions that reveal fundamental properties of matter
Fast EM solutions for reliable and high throughput electron microscopy
Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
Cathodoluminescence solutions that reveal fundamental properties of matter
Fast EM solutions for reliable and high throughput electron microscopy
Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
Take your research to the next level with the power of automation and the unprecedented speed of the next generation electron microscopy solutions. Make statistically significant conclusions from your data easily, whether that is in pathology, neurobiology, connectomics, toxicology, cell biology, or any other application in life sciences where both detail and context are important.
Electron microscopy (EM) is a powerful microscopy technique, which is widely used to examine the structures of cells, tissues, and organs, and to bring the researchers closer to answering fundamental questions. Thanks to the high resolution it offers, even small morphological differences can be identified and compared. Moreover, EM is increasingly being used in large-scale life science projects, either for volume imaging or large area mapping. In both cases, the desire to resolve nanoscale details is combined with the desire to place these observations into a larger context, which can cover a large area or span through a three-dimensional volume.
Such projects often face several limitations, particularly when multiple samples must be compared. Traditional EM workflows make acquiring statistically relevant data extremely time-consuming or even an unfeasible prospect. Fast electron microscopy brings much needed automation and high throughput to the table. It’s the ability to get both complete overview and in-depth data at nanometer resolution that makes fast electron microscopy so attractive. We developed a high-speed and fully automated electron microscope, FAST-EM. It eliminates the bottleneck created by the throughput of conventional electron microscopes.
Collect nanoscale detail while retaining larger context of the sample
Achieve high, sustained, throughput and image hundreds of sections with high levels of autonomy
Faster imaging enables collection of data from more samples, conditions, or time points
Get the most out of your instrument with our guidance and help
Dr. Jacob Hoogenboom
-Faculty of Applied Sciences, TU Delft