Breakthroughs in nanoscale materials science
We turn advanced Cathodoluminescence into routine nanoscale workflows, so you can see how your materials really behave and move from slow, expert-dependent analysis to faster, actionable insight.
Delmic Material science technology
Accelerate material development with CL
Delmic CL detectors make nanoscale optical insights accessible to every user, from high-throughput intensity mapping to advanced spectral analysis and picosecond dynamics.
We cut measurement times down to their minimum by leveraging superior collection efficiency and scan strategies; directly reducing dose on beam sensitive samples and increasing throughput.
No more training bottlenecks or operator-dependent data variations. One click gives every user expert-level alignment and maximum collection efficiency, every session.
Smart automated workflows allow the system to run unsupervised for hours on end, maximizing the use of valuable microscope time.
Up to 8 unique imaging modes enable the full characterization of optical properties at the nanoscale and in-situ light-biasing.
Delmic’s modular design and open source software ensures your system will be able to benefit from future developments in sensor technology and automation.
Delmic Cathodoluminescence detectors
Delmic Materials product line
High-performance and multimodal cathodoluminescence detector for SEM
Plug-and-play panchromatic and RGB cathodoluminescence detector for SEM
Fiber-coupled time-resolved cathodoluminescence detector for SPARC Spectral
High-performance cathodoluminescence detector for intensity mapping.
Workflow results
From Quantum to Geology
Differentiation of grains and cement in a sandstone sample
Sample courtesy of :
W. Neijssen, FEI Company, (Houston USA)
Defect density determination in semiconductors
Sample courtesy of:
Delmic, Delft (NL)
Inspection of emission uniformity of InGaN/GaN microrods
Sample courtesy:
J. Ledig, Technische Universität Braunschweig
Large area RGB of detrital zircon grains reveal compositional differences.
Sample courtesey:
Ryan McAleer, USGS (Reston, USA)
Visualization of local surface plasmon resonances in gold nanorods.
Sample courtesy of
:
Toon Coenen, AMOLF/Delmic, NL.
Analysis of zircon crystals revealing growth zoning patterns.
Sample courtesy of
:
Siri Simonsen, University of Oslo, (Oslo, NO)
False-color CL imaging for mineral identification
Sample courtesy of
:
Ryan McAleer, USGS (Reston, USA)
Imaging of hybridized eigenmodes in coupled resonant silicon nanoparticles
Sample courtesy of
:
Toon Coenen, AMOLF/Delmic, NL
Large area screening of zonation patterns in zircon grains for geochronology
Sample courtesy of
:
Cameron Davidson, Carleton College, USA.
Delmic is present in 5 continents, supporting over 200 publications and counting.
Testimonials
See what world-class institutions have achieved with Delmic’s Material science technologies
Delmic's team provided valuable consultations on new functionalities and promptly addressed our demands for additional information, fostering a friendly and efficient collaboration.
Prof. Nahid Talebi
Leader of the Nanooptics group at Kiel University.
“It was very reassuring to know that the SPARC system was developed by a trusted and esteemed colleague in our field, rather than being some general-purpose solution in material science.”
Dr. Saskia Fiedler
The University of Southern Denmark (SDU), in the Nano Optics group
at the Mads Clausen Institute.
“We have very good experiences with the support by Delmic, the response time is short, and the service is always to our great satisfaction [...] The SPARC system is an elegant way to extend the microscopic analysis we perform using other methods.”
Dr. Daniel Abou-Ras, Dr. Klaus Schwarzburg, and Dr. Sebastian Schmitt
The Helmholtz-Zentrum Berlin (HZB).
