High-quality cathodoluminescence intensity mapping
Use the power of the SPARC Compact CL detector to understand the structural composition and luminescence properties of your material at the nanoscale. Gain valuable insights into processes such as crystal growth zonation in geological samples or defect structures in semiconductor samples, all with exceptionally high spatial resolution.
Advantages of SPARC Compact
Large area micro- and nanoscale analysis
Efficient and user-friendly workflow
Future-proof and easily upgradeable