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Investigate nanophotonic structures using cathodoluminescence

Visualize the optical response of complex nanostructures with cathodoluminescence (CL) imaging. Use CL to study your metallic, dielectric, or semiconductor nanostructures, including nanoparticles, nanowires, and photonic crystals. Additionally, you can explore the electromagnetic coupling between particles, and tune their optical response according to your needs.

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list-check Map the radiative local density of optical states

list-check Characterizing guided and resonant optical modes

list-check Measuring angular profiles to study directionality

list-check Measuring the polarization of emission for multipolar analysis

Plasmonics

In-depth characterization of plasmonics

Use CL imaging to reveal spectral characteristics of local optical resonances in plasmonic nanoparticles and metamolecules, and map dispersion, directionality, and polarization in plasmonic waveguides, metasurfaces, and metamaterials. Gain fundamental insights into novel plasmonic designs and phenomena, and characterize applied plasmonic and metamaterial devices for imaging and sensing.

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list-check Directly excite surface plasmon over a broad range of frequencies

list-check Unveil mode profiles and spectral characteristics at the nanoscale

list-check Study directionality and dispersion using angle-resolved CL imaging

Dielectric Photonics

Investigate dielectric materials below the diffraction limit

Measure the modal dispersion and distributions of dielectric materials such as photonic crystals well below the diffraction limit using CL imaging. Study the (polarization-sensitive) band structure and mode profiles of waveguides and cavities.

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list-check Investigate optical properties without perturbing the optical environment

list-check Acquire single-shot broad-band dispersion data

Imaging modes

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Fast-intensity imaging

list-check--neutral-dark The fastest and simplest method to obtain CL contrast

list-check--neutral-dark Fast scanning of large sample areas with high resolution

list-check--neutral-dark Identify regions of interest for more in-depth CL studies

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Angle-resolved imaging

list-check--neutral-dark Understand more about the direction in which light is emitted

list-check--neutral-dark Observe the performance of antenna structures

list-check--neutral-dark Gain insight into the band structure of periodic systems

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Hyperspectral imaging

list-check--neutral-dark Gain insight into the wavelength distribution of CL emission

list-check--neutral-dark Obtain valuable information on the local optical and structural properties of the material

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Polarimetry and polarization filtered spectroscopy

list-check--neutral-dark Gain key insights into light-matter interactions of your material

list-check--neutral-dark Lock spurious background radiation and correct for aberrating effects in the collection optics

list-check--neutral-dark Combine with angle-resolved imaging for ideal studying of polarization effects

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Lens-scanning energy-momentum imaging

list-check--neutral-dark Combine "conventional" angle-resolved and hyperspectral CL imaging

list-check--neutral-dark Characterize optical properties of (nano)materials in energy and momentum space in great detail

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Geology research

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SPARC Spectral
JOLT
SPARC Compact
Time-resolved
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Comprehensive cathodoluminescence detection

Perform a comprehensive analysis of your material of interest at the nanoscale with the SPARC Spectral CL detector. Gain valuable insights into material composition, crystal structure, optical modes, and band gap energy. Detect trace elements and dopants, or improve the device/material efficiency through nanoscale defect analysis.

Frame 194 Ensures the best data quality

Frame 194 Tailored to your research needs

Frame 194 Future-proof and easily upgradeable

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Fast and flexible cathodoluminescence detection

Use JOLT for rapid and convenient CL detection. Gain valuable insights into geological materials by mapping the emitted CL intensity to reveal properties such as crystal growth, zonation, deformation, and defect structures. Additionally, you can measure the CL emission of bulk materials such as semiconductors and rare-earth doped materials.

Frame 194 Rapidly obtain micro- and nanoscale insights

Frame 194 Efficiently screen your materials for further analysis

Frame 194 Easy integration and operation

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Gain nanoscale insights into your materials

Use the power of the SPARC Compact CL detector to understand the structural composition and luminescence properties of your material at the nanoscale. Gain valuable insights into processes such as crystal growth zonation in geological samples or defect structures in semiconductor samples, all with exceptionally high spatial resolution.

Frame 194 Large area micro- and nanoscale analysis

Frame 194 Efficient and user-friendly workflow

Frame 194 Future-proof and easily upgradeable

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Time-resolved cathodoluminescence imaging

Use time-resolved CL to unlock the decay trace and lifetime of your photon emitter. Additionally, you can conduct a comprehensive analysis of the photon distribution over time to gain detailed insights into your semiconductor or quantum material.

Frame 194 Perform lifetime imaging and g(2) imaging

Frame 194 Get insights into intrinsic material properties, nanoscale quality, and defects

Frame 194 Study the quantum nature of light and single-photon emitters

Frame 194 Pump-probe cathodoluminescence imaging

Interested to learn more about our time-resolved CL solution?
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Insights

All insights
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Plasmonics Category tag

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