Integrated CLEM combines the two imaging methods EM and FM, to offer a powerful streamlined and automated acquisition of high resolution CLEM images in the SEM. The platform is a retro fit compatible with SEM’s from the entire range of manufacturers. In iCLEM, the cells of interest can be identified using FM. Subsequently, a high magnification EM image can be acquired at the desired location to reveal structural details at high resolution. Following this, the two acquired images will be overlayed using the high accuracy automated overlay procedure. It therefore offers seamless CLEM imaging with no sample transfer or manual overlay, providing high quality data in a user-friendly manner, ensuring that you can focus on analyzing data rather than on acquiring it.